1995P-1DEO-009T Trail Die Obverse
Error
Description
Cataloged by Trail Dies as 1995P-1DEO-009T, this trail die obverse variety appears on a 1995-P Lincoln Memorial cent struck at the Philadelphia Mint. The Lincoln Memorial cent was produced in copper-plated zinc composition weighing 2.5 grams with a 19 mm diameter and a plain edge. Trail dies are a specialized category of die variety where the die shows evidence of a partial or secondary impression from a misaligned or bouncing hub during the die-making process, creating trail-like lines or shadows that emanate from design elements in specific directional patterns. On this variety, dual directional trail lines are visible from the Y of LIBERTY and the first two digits of the date, with the offset directions measured at 130 and 310 degrees. These opposing directional angles indicate the hub contact produced trail marks radiating in two directions simultaneously, a characteristic that distinguishes trail dies from standard doubled dies where the displacement is typically in a single direction. The die was found by Jason Dick, whose discovery contributed to the growing catalog of trail die varieties on Lincoln cents. Die markers document this variety in Stage B, with the obverse in mid die state showing die scratches between Lincoln's nose and chin. The reverse, also in mid die state, exhibits a die crack from the top of column 5 through the two periods in E PLURIBUS UNUM, through the A of STATES, and into the rim. This reverse die crack traces a substantial path across multiple design elements, providing an excellent secondary diagnostic for attribution. Trail die varieties represent a relatively recent area of die variety research, and the systematic cataloging of trail dies on Lincoln Memorial cents has revealed that this phenomenon occurred with meaningful frequency across the series' production history.
Attribution History
- Discovered by Jason Dick
- Expert attribution by Trail Dies
External References
Community & Reference
Related Errors
More Trail Die Obverse Errors
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