1943 Doubled Die Reverse DDR-008

Description

Cataloged by VarietyVista under UVC-728 and DMR-085, this 1943 Jefferson Nickel DDR-008 exhibits light spread on E PLURIBUS UNUM and UNITED STATES OF AMERICA that increases from left to right — a graduated doubling pattern where the hub displacement geometry placed the pivot or minimal-displacement point on the left side of the die, producing progressively greater separation between primary and secondary impressions moving rightward across the inscriptions. Three die stages are documented: Stage A is early die state (EDS, unconfirmed); Stage B is mid-die-state (MDS, unconfirmed); and Stage C is late die state showing a die crack from the center of Monticello's dome running south to the steps between pillars #2 and #3, with the obverse also in LDS. The dome-to-steps die crack in Stage C traces a dramatic vertical path through the center of the building's architecture, providing a visually striking die state marker for late-production specimens. The 1943 Jefferson Nickel was produced during World War II, and while the 1943-P with large mintmark was struck in wartime silver alloy, Philadelphia production also included standard composition pieces in 75% copper and 25% nickel weighing 5.00 grams with a 21.21 mm diameter. Felix Schlag designed both the Jefferson portrait obverse and the Monticello reverse. The left-to-right increasing doubling pattern is characteristic of pivoted hub doubling where the pivot lies toward the left, and collectors examining potential specimens should focus their initial scrutiny on the rightmost elements — AMERICA and the right portions of UNUM — where the separation is most pronounced and easiest to confirm under magnification before working backward toward the less-doubled left-side elements.

Die Markers

• UVC-728
• DMR-085
• Stage A:
• EDS (unconfirmed)
• Stage B:
• MDS (unconfirmed)
• Stage C:
• Die crack from center of dome South to steps between pillar # 2 and # 3 – LDS
• Obverse is LDS

Attribution History

• Discovered by Timothy Wissert.
• Expert attribution by VarietyVista

External References