View All 2008 (P) Hawaii State Quarter

2008 Typical Die Clash TDC-25C-2008-02HI

Error
2008 (P) Quarter Typical Die Clash error coin
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Verified LegacyTypical Die Clash

Attribution

M

Verified by

MadDieClashes

Market Value
N/A
Rarity Index
N/A
Discovery Date
2008
Last Sold
N/A

Description

Second typical die clash identified for the 2008 Hawaii State Quarter by the MadDieClashes attribution service, TDC-25C-2008-02HI represents the middle entry in a series of at least three documented clashing events on the fiftieth and final design of the original State Quarter program. Die clashing — the direct impact between obverse and reverse dies without an intervening planchet — leaves each die marked with incuse impressions of the opposing design, and these marks then transfer as faint raised elements onto every coin subsequently struck from the affected dies until the clash marks wear away through extended use or the dies are retired. The 02 sequence number distinguishes this clash event from the first (01HI) and third (03HI) documented events, each involving distinct die pairs or distinct production moments. Don Everhart's Hawaii reverse design features King Kamehameha I — the warrior king who unified the Hawaiian Islands in 1810 — alongside the island chain outline and the Hawaiian state motto. The prominent figure of Kamehameha, with his feathered cloak and extended arm, creates substantial relief variations across the reverse die that produce distinctive clash transfer patterns when the dies impact without a planchet. John Flanagan's Washington obverse, standard across all State Quarter issues from 1999 through 2008, provides the source design for the clash marks visible on the Hawaii reverse, while the reverse's unique Hawaiian design elements produce the obverse clash marks. Three documented typical die clashes for the Hawaii design specifically may reflect the intensity of year-end production as the Mint completed the final state in the program. Collectors should examine both sides under 10-15x magnification with angled illumination, searching the field areas between design elements for faint raised traces of the opposing die's design transferred during the clash event.

Attribution History

  • Discovered by MadDieClashes
  • Expert attribution by MadDieClashes

External References

Last updated: August 6, 2026

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