1960 Doubled Die Obverse WDDO-024

Description

Twenty-fourth in the Wexler obverse doubled die census for the 1960 Jefferson nickel, WDDO-024 exhibits Class II (Distorted Hub) doubling producing a very close spread on IN GOD WE TRUST. The depth of the DDO census for the 1960 date — reaching at least 24 documented varieties — reflects both the substantial production volume and the active research community that has systematically examined Jefferson nickels from this era. Philadelphia struck approximately 55.4 million nickels in 1960, a moderate production run that nonetheless generated enough die pairs to support an extensive variety census. The Class II distorted hub mechanism involves a warped or asymmetric working hub that transfers its distortion to every die it produces, meaning multiple dies could potentially carry similar doubling characteristics depending on how many were sunk from the affected hub. However, each WDDO number typically represents a die distinguishable by its unique die markers. The reverse die marker — a slanted die scratch through the small left window of Monticello — provides a pinpoint diagnostic for confirming the correct die independent of the doubling analysis, while the obverse carries no noted markers beyond the doubling itself. This variety is designated as a proof strike, as indicated by the cross-reference notation "Wexler Variety ID: 1960 WDDO-024 Proof." Philadelphia produced proof sets in 1960 that included the nickel, and proof dies were subject to the same hubbing process that could introduce hub doubling. Brian A. Ribar, credited as the expert attribution source, has contributed extensively to Jefferson nickel doubled die documentation. Collectors should locate the slanted die scratch through the small left window on the reverse to verify the die, then examine IN GOD WE TRUST at 15-20x magnification for the characteristic thickening that marks very close Class II hub displacement.

Attribution History

• Discovered by Brian A. Ribar
• Wexler Variety ID: 1960 WDDO-024 Proof
• Expert attribution by Brian A. Ribar

External References