View All 1990 (P) Lincoln Memorial Cent

1990 Atypical Die Clash ADC-1C-1990-01

Error
1990 (P) Cent Atypical Die Clash error coin
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Verified LegacyAtypical Die Clash

Attribution

M

Verified by

MadDieClashes

Market Value
N/A
Rarity Index
N/A
Discovery Date
1990
Last Sold
N/A

Description

Cataloged by MadDieClashes as ADC-1C-1990-01, this atypical die clash documents the first identified non-standard clash variety on the 1990 (P) Lincoln Memorial cent — establishing the baseline entry for atypical clash documentation on this date. Atypical die clashes stand apart from their typical counterparts through the abnormal orientation of the die contact: rather than the dies meeting in standard alignment when a planchet fails to feed, one die is rotated, tilted, or laterally offset relative to the other, transferring design impressions into positions that cannot occur under normal conditions. This geometric displacement is the signature that distinguishes atypical from typical clashes and makes them more analytically interesting for die variety specialists. The 1990 Lincoln Memorial cent continues the copper-plated zinc composition introduced in 1982, pairing Victor David Brenner's Lincoln portrait obverse with Frank Gasparro's architectural Memorial reverse. Philadelphia struck approximately 6.85 billion cents in 1990, sustaining the enormous production volumes of the late 1980s that generated the mechanical stress and operational complexity conducive to press malfunctions. The "01" designation as the first documented atypical clash for the 1990 date may indicate either that fewer atypical clashes occurred than in adjacent years (1989 produced at least three, and 1983 yielded eight) or that the 1990 issue has received comparatively less specialist attention. The transferred design elements on this variety — Lincoln Memorial architectural features appearing in non-standard positions on the obverse, or Lincoln portrait traces ghosting at abnormal angles on the reverse — require careful interpretation under oblique illumination and 10-20x magnification. Collectors should systematically scan both surfaces for design fragments in positions inconsistent with normal die alignment, using the known spatial relationship between the obverse and reverse designs as a reference for identifying the anomalous transferred impressions.

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Last updated: August 31, 2026

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