2005 Doubled Die Reverse DDR-057
Error
Description
The 2005 Doubled Die Reverse DDR-057 is a doubled die reverse (DDR) variety, where die hubbing misalignment produced visible doubling on the reverse design. This variety was discovered on the 2005 (P) Minnesota State Quarter, part of the State Quarters 1999-2008 series. Die markers: UVC-1512 DMR-060 Stage A: EDS (unconfirmed) Stage B: Die chips in both lower 8s of 1858 – MDS Die break on Left side of state outline at tree line Die chips in and depression under designer's initials – MDS Die crack across the front of the bust Die chip between upper TR of TRUST Stage C: Reverse is LMDS Die break in ribbon – LMDS Stage D: LDS (unconfirmed). Die Stages and Markers UVC-1512 DMR-060 Stage A: EDS (unconfirmed) Stage B: Die chips in both lower 8s of 1858 – MDS Die break on Left side of state outline at tree line Die chips in and depression under designer's initials – MDS Die crack across the front of the bust Die chip between upper TR of TRUST Stage C: Reverse is LMDS Die break in ribbon – LMDS Stage D: LDS (unconfirmed).
Die Markers
- UVC-1512
- DMR-060
- Stage A:
- EDS (unconfirmed)
- Stage B:
- Die chips in both lower 8s of 1858 – MDS
- Die break on Left side of state outline at tree line
- Die chips in and depression under designer's initials – MDS
- Die crack across the front of the bust
- Die chip between upper TR of TRUST
- Stage C:
- Reverse is LMDS
- Die break in ribbon – LMDS
- Stage D:
- LDS (unconfirmed)
Attribution History
- Discovered by James Wiles
- Expert attribution by VarietyVista
External References
Additional Notes
Die Stages and Markers UVC-1512 DMR-060 Stage A: EDS (unconfirmed) Stage B: Die chips in both lower 8s of 1858 – MDS Die break on Left side of state outline at tree line Die chips in and depression under designer's initials – MDS Die crack across the front of the bust Die chip between upper TR of TRUST Stage C: Reverse is LMDS Die break in ribbon – LMDS Stage D: LDS (unconfirmed)