2005 Doubled Die Reverse DDR-036
Error
Description
The 2005 Doubled Die Reverse DDR-036 is a doubled die reverse (DDR) variety, where die hubbing misalignment produced visible doubling on the reverse design. This variety was discovered on the 2005 (P) Minnesota State Quarter, part of the State Quarters 1999-2008 series. Die markers: UVC-1490 DMR-038 Stage A: EDS (unconfirmed) Stage B: Die scratch North from the third tree to the state – MDS Large die break in upper ribbon – MDS Depression in field below designer's initials Die crack across base of bust Stage C: Light die crack Northwest from upper Left outline to rim – LMDS Double depressions under designer's initials – LMDS Die chip between upper TR of TRUST Stage D: LDS (unconfirmed). Die Stages and Markers UVC-1490 DMR-038 Stage A: EDS (unconfirmed) Stage B: Die scratch North from the third tree to the state – MDS Large die break in upper ribbon – MDS Depression in field below designer's initials Die crack across base of bust Stage C: Light die crack Northwest from upper Left outline to rim – LMDS Double depressions under designer's initials – LMDS Die chip between upper TR of TRUST Stage D: LDS (unconfirmed).
Die Markers
- UVC-1490
- DMR-038
- Stage A:
- EDS (unconfirmed)
- Stage B:
- Die scratch North from the third tree to the state – MDS
- Large die break in upper ribbon – MDS
- Depression in field below designer's initials
- Die crack across base of bust
- Stage C:
- Light die crack Northwest from upper Left outline to rim – LMDS
- Double depressions under designer's initials – LMDS
- Die chip between upper TR of TRUST
- Stage D:
- LDS (unconfirmed)
Attribution History
- Discovered by Bob Piazza
- Expert attribution by VarietyVista
External References
Additional Notes
Die Stages and Markers UVC-1490 DMR-038 Stage A: EDS (unconfirmed) Stage B: Die scratch North from the third tree to the state – MDS Large die break in upper ribbon – MDS Depression in field below designer's initials Die crack across base of bust Stage C: Light die crack Northwest from upper Left outline to rim – LMDS Double depressions under designer's initials – LMDS Die chip between upper TR of TRUST Stage D: LDS (unconfirmed)