View All 1980 (D) Lincoln Memorial Cent

1980-D Repunched Mintmark WRPM-005

Error
1980-D Repunched Mintmark WRPM-005
Click to zoom
Verified LegacyRepunched Mint Mark

Attribution

W

Verified by

Wexler Team

Market Value
N/A
Rarity Index
N/A
Discovery Date
1980
Last Sold
N/A

Description

D/D Tilted Die Markers: Obverse: Stage A: Concentric die scratches throughout much of the obverse. Die gouge south of I in IN. Stage B: Die gouge behind the lower bust. Die scratches above E in LIBERTY and running NNW from nose barely visible. Die gouge under IN in IN faintly visible. Die gouges in front of lips. Die gouge right of G in GOD. Die gouge nearly touching upper right side of R in LIBERTY. Die gouges left of lower left bust. Die gouge at back base of Lincoln’s hair. WSW/ENE die scratch behind the head at the level of the ear. Stage C: Die gouges behind the lower bust, in front of lips. right of R in LIBERTY, and behind the hair still present. Die gouge right of G in GOD faint. Die scratch behind the head still visible. New strong die gouges in field at level of Lincoln’s eyebrow. Stage D: Die gouges in field at level of Lincoln’s eyebrow are still visible. Numerous die scratches show on and in front of Lincoln’s nose. Parallel, WSW-ENE oriented die scratches show to the north and east of the mint mark. A curved die scratch connects the lower 1 in the date with the front of the bust. A series of distinctive die scratches show above LIBERTY. No die gouge under First T in TRUST. Stage E: Stage C markers very faint. Die scratch runs NE to SW left and above 1 in date. Die gouges northeast of date. Die scratch runs ENE from top of R in LIBERTY. Strong die gouge under first T in TRUST. New die gouges in field under ST in TRUST. Reverse: Stage A: Die gouge under U in UNITED. Die gouge inside upper C in AMERICA. Die gouges inside N in CENT. Die gouge above right side of N in ONE. Die crack from right base to rim. Die cracks column 1, 2, 7, 8, 9, 12. Stage B: New reverse die. Die crack left memorial roof to E in UNITED. Die gouge right of U in UNITED. Die gouge above left first T in STATES. Die scratch between the lower T and E of STATES. Die gouge left of M in AMERICA. Die gouge inside the O of ONE. Die gouge left of T in CENT. Stage C: Die crack left memorial roof into the E in UNITED. Light die crack right memorial base. Die crack on right cornice. Light die crack left memorial base. Die gouge between U and N in UNITED. Die gouge at the rim above the left side of the first T in STATES and die scratch between lower TE in STATES still visible. Die gouge left of M in AMERICA weak. Die crack on column 2. Die gouge under S in PLURIBUS. Die gouge inside the O of ONE still present. Die gouge above E in CENT. Die gouge left of T in CENT still visible. Stage D: Die clash visible in Memorial bays 2, 3 & 4. Die gouge in O of ONE weakly visible. Die crack left memorial roof through E in UNITED. Light die cracks show on the left and right memorial base areas. No die crack from the left edge of the Memorial roof into the N in UNITED. Die gouge at rim above the left side of the first T in STATES weak, but visible. Die gouge left of the M in AMERICA weak. Fresh die scratch pattern under the AME in AMERICA. Die gouge under the S in PLURIBUS weak. Die gouge right of U in UNITED weak. Die scratch between the lower T and E in STATES weakly visible. Die gouge inside lower C, above E, and left of N in CENT. Stage E: Die crack right memorial base now extends to rim. Die crack left memorial base now extends to rim. Die crack left cornice through N in UNITED. Die crack left memorial roof through E in UNITED. Die clash still visible in Memorial bays 2, 3 & 4. NW-SE oriented die scratch in lower Memorial bay 3. Die gouge at rim above the left edge of the first T in STATES faint. Die gouge right of U in UNITED faint. Die gouges inside lower C, above E, and left of N in CENT faint. Die gouge right memorial base under column 11. Die cracks on right cornice and column 2. Die gouge under S in PLURIBUS very faint. Die scratch between the lower T and E of STATES worn away. Die gouge inside the O of ONE worn away. Die scratch pattern under AME in AMERICA from Stage D very weak.

Attribution History

  • Coppercoins: 1980D-1MM-004 Comments: The original listing for WRPM-007 was discovered to be a duplicate of WRPM-005 and has been added to this listing.; Wexler Variety ID: 1980-D 1¢ WRPM-005
  • Expert attribution by Wexler Team

External References

Last updated: May 12, 2026