LDB45-1962-001 Die Break

Description

This proof-strike entry for the 1962 Lincoln Memorial Cent records the same physical die break variety documented under the business strike parent as LDB45-1962-001, but situated within the proof production context at the Philadelphia Mint. The variety is a BIE-type die break — a crack or chip that develops in the die face between the letters B and E of LIBERTY, producing a raised vertical element on the struck coin that visually resembles the letter I. In the Cuds on Coins classification system this piece is designated a "BIEIR," represented by the LDB45 prefix, indicating a specific positional variant within the broader BIE family. The underlying die state corresponds to a later stage of Hardy die 62P-5SBLM-1, where the original die chip between B and E matured into the full BIE formation. Cohen does not list the variety independently. Proof Lincoln cents from 1962 were struck at the Philadelphia Mint using specially prepared polished planchets and polished dies, with each coin receiving multiple strikes to bring up the full design detail and mirror-like field quality that collectors expect. The controlled, lower-pressure proof production environment typically extends die life compared to high-speed business strike presses, but the same progressive die fatigue that creates BIE breaks on circulation-strike dies can also manifest on proof dies when a flaw develops during the production run. The 1962 proof mintage of 3,075,645 sets was among the last to use the original 95% copper alloy with a trace of tin, and proof die breaks from this era remain collectible for their combination of proof surface quality and visible die failure. Attributed by Cuds on Coins, with cross-references to Cohen (Not Listed) and Hardy 62P-5SBLM-1.

Attribution History

• Discovered by Earl Williams
• Cross reference: Cohen Not Listed, Hardy Later stage of 62P-5SBLM-1 now has a Die Chip between B&E “BIE”. 02/21/2016.
• Expert attribution by Cuds on Coins

External References