1959-D Repunched Mintmark WRPM-039
Error
Description
D/D Tilted (Rotated) Die Markers: Obverse Stage A: Die scratch (tooling) at left center of the first 9 in the date curving south. Die scratch (tooling) at center of the lower opening of the 5 in the date curving southwest. Die gouge on the outside of the vest positioned SW of the 1 in the date. Die scratch (tooling) at the left lower area of the mint mark curving southwest into the vest. E/W die scratch below the bowtie. Weak die gouge above the L in LIBERTY. Die scratches at the top of the hair positioned below the E of WE. NE/SW die scratch at the lower right side of the E in WE. Curving E/W die scratch at the hairline. Obverse Stage B: Stage A die scratches are weak. Die gouge above the L in LIBERTY is weaker. Die gouge at the hairline is weak. Obverse Stage C: All stage A die scratches are abraded away. Die gouge at the hairline still shows weak. Light NW/SE die scratch through the bottom of the 1 in the date. Weak die clash running east from the vest and about halfway to the center of the 1 in the date. Weak NE die crack from the top of the ear. Light NW die scratch from the top of the head positioned below WE. Obverse Stage D: Die crack at the ear is stronger and runs into the head. All previous scratches abraded away except for a weak die scratch at the bottom of the 1 in the date. Die clash is weak. Obverse Stage E: Die crack on the head is stronger and turns east further into the head. The die clash is very weak. All previous die scratches are abraded away. Reverse Stage A: Small die chip (dot) NW from the left Memorial base tip. Die scratch SSW from the lower right side of the E of EPU to the top of the roof. Die scratch west from the lower left side of the D in UNITED and running under the E of UNITED. Reverse Stage B: Die scratch below the E of EPU abraded away. All other stage A die scratches are weak. Die gouge on the left center of the E in EPU. Light die crack down column one with a chip slightly above center. Reverse Stage C: All stage A die scratches abraded away. Stage B die gouge at EPU is still present. New die gouge below the center of the E in EPU. WNW/ESE and NW/SE die scratches slightly above upper center of bay eleven and to the right of column twelve. Light die crack along the edge of the right side cornice and the right eave. Die gouge (dot) near the lower left area of the T in CENT. Die scratch east from right center of the F in OF to the left center of the first A in AMERICA. Reverse Stage D: All previous die scratches abraded away. Die chips are weak at EPU. Die chips on the crack at the right cornice. Die crack down column twelve. Die chip on the top of the left Memorial base tip. Reverse Stage E: Larger die chip on the left base tip. Stronger die chip on column one with a second small chip below the center. Die chip above center of column eleven. Large die chip on the upper half of column twelve. Larger die chips on the right cornice. Die chips on the right eave. Die gouge in the field below the right base tip. Obverse Stage A:
Attribution History
- None known; Wexler Variety ID: 1959-D 1¢ WRPM-039
- Expert attribution by Wexler Team