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1955-S Repunched Mintmark RPM-004

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1955 (S) Cent Repunched Mint Mark error coin
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Market Value
N/A
Rarity Index
N/A
Discovery Date
1955
Last Sold
N/A

Description

The 1955-S Repunched Mintmark RPM-004 is a repunched mint mark variety of the United States cent. This variety was discovered on the 1955 (S) Lincoln Wheat Cent, part of the Lincoln Wheat Cents 1909-1958 series. Die markers: UVC-1068 DMR-009 Stage A: Short, strong, horizontal die gouge on lapel fold – EDS Die gouge between D of UNITED and S of STATES – EDS Stage B: Light die gouge on lapel fold – MDS Die break lower Right wheat to rim – MDS UVC-549 DMR-007 Stage C: Obverse is MDS Reverse die changed – MDS Die gouge through upper M of UNUM Light die crack in lower Right wheat grains Stage D: Die crack BIE of LIBERTY – LDS Die gouge through E of EPU – LDS Die crack in Right wheat grains extends to rim Die crack Northwest tip of E of ONE Stage E: Light die crack in hair – LDS Die crack in Left wheat grains – LDS Strong die crack Right wheat to rim Stage F: Obverse is LDS Large die chip in Right wheat grains – LDS     Stage G: Light mound die chip in lower first 5 of date – VLDS Two die chips in Right wheat grains – VLDS Stage H: Die chip in lower first 5 of date – VLDS Reverse is VLDS Stage I: Obverse is VLDS Second die crack from lower Right wheat to rim – VLDS Die crack from lower Left wheat to rim Stage J: Obverse is VLDS Retained cud on Right wheat – VLDS UVC-550 DMR-008 Stage K: Obverse is VLDS Reverse die changed – EDS Stage L: Die break BIE of LIBERTY – VLDS Reverse is EMDS.

Die Markers

  • UVC-1068
  • DMR-009
  • Stage A:
  • Short, strong, horizontal die gouge on lapel fold – EDS
  • Die gouge between D of UNITED and S of STATES – EDS
  • Stage B:
  • Light die gouge on lapel fold – MDS
  • Die break lower Right wheat to rim – MDS
  • UVC-549
  • DMR-007
  • Stage C:
  • Obverse is MDS
  • Reverse die changed – MDS
  • Die gouge through upper M of UNUM
  • Light die crack in lower Right wheat grains
  • Stage D:
  • Die crack BIE of LIBERTY – LDS
  • Die gouge through E of EPU – LDS
  • Die crack in Right wheat grains extends to rim
  • Die crack Northwest tip of E of ONE
  • Stage E:
  • Light die crack in hair – LDS
  • Die crack in Left wheat grains – LDS
  • Strong die crack Right wheat to rim
  • Stage F:
  • Obverse is LDS
  • Large die chip in Right wheat grains – LDS
  • Stage G:
  • Light mound die chip in lower first 5 of date – VLDS
  • Two die chips in Right wheat grains – VLDS
  • Stage H:
  • Die chip in lower first 5 of date – VLDS
  • Reverse is VLDS
  • Stage I:
  • Obverse is VLDS
  • Second die crack from lower Right wheat to rim – VLDS
  • Die crack from lower Left wheat to rim
  • Stage J:
  • Obverse is VLDS
  • Retained cud on Right wheat – VLDS
  • UVC-550
  • DMR-008
  • Stage K:
  • Obverse is VLDS
  • Reverse die changed – EDS
  • Stage L:
  • Die break BIE of LIBERTY – VLDS
  • Reverse is EMDS

External References

Last updated: June 20, 2026