1954 Doubled Die Obverse DDO-001

Description

Extreme extra thickness on date, designer's initials top to bottom, IN GOD WE TRUST, LIBERTY, and head.

Die Markers

• UVC-253
• DMR-003
• Stage A:
• Die chip below 4 of date – EDS
• Strong lower J of designer's initials
• Die scratch in field Southwest from eyebrow
• Reverse is EDS
• Stage B:
• Die scratch in field Southwest from mouth – EMDS
• Reverse is EMDS
• Stage C:
• Die scratch Southwest from inner ear – MDS
• Medium lower J of designer's initials
• Reverse is MDS
• Stage D:
• Weak lower J of designer's initials – LDS
• Die gouge West from Left olive stem – LDS

Attribution History

• Discovered by Harry Yonkura
• FS-101
• Expert attribution by VarietyVista

External References